Custom Fabrication Window Clamp & Anvil Block

Description:

Custom Fabrication of Window Clamps & Anvil Blocks for the Semiconductor Industry

We provide custom fabrication of precision window clamps and anvil blocks designed to meet the high-accuracy, low-stress requirements of semiconductor manufacturing and inspection processes.

Our window clamps are engineered to securely hold delicate semiconductor components while maintaining a clear inspection or processing window, making them ideal for optical measurement, laser applications, metrology, and vision systems. The design ensures maximum stability without obstructing critical areas, enabling accurate, repeatable results.

Our anvil blocks are precision-machined to serve as stable reference and support surfaces for pressing, alignment, bonding, inspection, and measurement operations. Built for flatness, rigidity, and durability, they help maintain consistent part positioning and process reliability, even in high-volume environments.

Key Features & Benefits:

  • Custom-designed window clamps and anvil blocks based on part geometry and process requirements

  • Supports applications such as laser decapping, cross-sectioning, inspection, metrology, and automation

  • High-precision machining for tight tolerances and repeatable positioning

  • Minimizes stress, deformation, and vibration on sensitive semiconductor parts

  • Materials compatible with cleanroom, ESD-safe, and contamination-controlled environments

  • Improves measurement accuracy, process stability, and throughput

  • Suitable for R&D, pilot lines, and full production

From design validation to final fabrication, our window clamps and anvil blocks are built to protect critical components while enabling precise, unobstructed access for inspection and processing—because in semiconductor manufacturing, control, consistency, and microns matter. 🔬⚙️

If you want, I can also:

  • condense this into a one-paragraph website version

  • make a highly technical spec-style description

  • or tailor it for laser, metrology, or FA equipment applications

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CHARACTERISTICS
  1. Easy operation
  2. Peak hold function
  3. Comparator function
  4. Memory function
  5. Automatic power off
  6. Local Newton value input

Radiographic Testing (RT) is a non-destructive testing (NDT) method which uses X-rays to examine the internal structure of manufactured components to identify any flaws or defects. Microfocus X-ray inspection is a 3D non-destructive inspection (NDI) technique that allows the testing and 3D analysis of various materials in a non-destructive manner. It is used in a wide range of industries, including the electronics, automotive, semiconductors, and aerospace industries.

Shimadzu provides a comprehensive lineup of microfocus X-ray inspection systems and solutions for high resolution inspection of electronic assemblies, components, and printed circuit boards (PCB). Our product lineup includes the Xslicer SMX-1010/1020, boasting significantly improved image quality and a simplified workflow; and the Xslicer SMX-6010, featuring high-accuracy images with a wide dynamic range that enables detailed observation of internal structures and defects. Learn more about our full lineup below.

• Deliver High Precision Measurement via 3 load cells even if there is unbalance load. The tester alone can meet a variety of specifications

such as JIS K6400-2, JASO B408 & etc.

• This UFT series can satisfy a variety of urethane foam test. The 3 load cells enable this tester to deliver high precision load detection even in the presence of unbalance load. Test sample placed on the wide test table (1000 x 700mm) can be measured just as it is. For instance a car seat can also be place on the test table and measurement can take place as it is. The installed urethane foam testing program can change “%”, “Cycle” and “Time”.

• The tester also meets the Hardness Test and Deflection Test Specifications of Automotive Manufacturer under fixed load.

• Test Conditions and Results can be stored in USB Memory and export to Microsoft Excel for Test Inspections. The tester also adopts “Program Load” via USB Memory and it can also meet requirements of any custom made test.

• External control test using PC Software is also possible.

TYPE OF TEST
  • Hardness Test JIS K6400-2 Method A, B, C & D
  • Compression Deflection Test JIS K6400-2 Method A-1 & A-2
  • Compression Deflection Test JIS K6400-2 Method B
  • Micro Displacement Spring Rate Test
  • Stress Relaxation Test
  • Compression Load Test
  • External Control Test via PC

Single quadrupole mass spectrometry is a mass detection technology that can be adapted to a wide range of applications. Shimadzu’s single quad GC-MS offers ultimate high-speed and high-efficiency analysis with unparalleled performance to meet your analysis needs in fields such as environmental pollution monitoring, forensics, material science, and more.​

Shimadzu’s single quadrupole GC-MS systems provide reliable routine analysis and smart solutions for maximizing the potential of laboratories. Our portfolio includes the GCMS-QP2020 NX and the GCMS-QP2010 SE single quad GC-MS. Browse Shimadzu’s entire product range below.

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