Automatic span calibration
Operator can choose from two types of fully-automatic span calibration methods. “PSC” is initiated based on temperature…
We specialize in the custom design and fabrication of precision clamps and inserts engineered specifically for the stringent requirements of the semiconductor industry, where accuracy, cleanliness, and repeatability are critical.
Our clamps and inserts are designed to secure delicate components without inducing stress, deformation, or contamination, making them ideal for inspection, metrology, assembly, testing, laser processing, and automation applications. Each solution is tailored to the exact geometry, material, tolerance, and process conditions of the customer’s application.
Key Capabilities & Benefits:
Custom clamps and inserts for wafers, leadframes, packages, substrates, and precision parts
Designed for vision systems, CMMs, laser systems, and automated equipment
High-precision machining to support tight tolerances and repeatable positioning
Materials compatible with cleanroom, ESD-sensitive, and chemical-resistant environments
Minimizes part movement, vibration, and measurement error
Reduces setup time and improves process consistency
Built for high-volume and high-mix semiconductor manufacturing
From concept and design to fabrication and validation, our clamps and inserts are built to protect critical parts while maximizing process accuracy and throughput. Classic precision, modern execution—because in semicon, microns matter. 🔬✨
The line of Shimadzu top-loading balances is engineered with the UniBloc mechanism, resulting in unrivaled response, stability and durability. Powerful features support any imaginable weighing application. The UW Series includes internal calibration and fully-automatic calibration functions.
EQUIPPED WITH SMART ZERO FUNCTION
Displacement of zero point detection will be easier and smooth by smart zero function
BUILT–IN USB MEMORY UNIT
Enable the tester to perform more efficient load testing. When use in production line, it is not necessary to bring a personal computer into the line. A USB Thumb Drive with stored test result can be taken out from the tester to examine in other place. Measurement conditions can also be store in the USB Memory.
TESTER DATA STORING
With Built in 16GB memory able to store about 10,000 testing result
DISPLAY AND PRINTING
You can see test results and curve of load displacement with high density LCD on the MAX tester and print out through the built-in printer. The CENTRONICS INTERFACE enables the external printer to print test results out in form of test report. (ESCIP based)
DATA PICK UP FUNCTION
The standard test program on the MAX can perform most of general compression/tension load test. Its data pick-up function can pick specific data from test results.
PROGRAM CHANGE THOUGH USB PORT
Since the MAX series is operated with a Test Program that has been installed. It is easy to change the Test Program. In other words, one MAX tester can be use for multiple purposes.
MULTIPLE LANGUAGE TESTER
Tester consists of English, Japanese, Korean & Chinese (Simplified & Traditional) Language. Globalization of manufacturing support and can be used in most part of the world.
The Energy Dispersive X-ray Fluorescence spectroscopy (ED-XRF) is a non-destructive analytical technique for identifying and quantifying elemental compositions in solid, powder, and liquid samples. It is widely used for non-destructive elemental analysis for quality and process control in applications including metals, chemicals, polymers, environmental testing, food safety, and pharmaceuticals, etc.
Shimadzu has been a world leading manufacturer of high-quality ED-XRF spectrometers and provides a comprehensive product lineup including the EDX-7200 flagship model, which supports compliance of the newest consumer and environmental regulations; the EDX-8100, which offers a high level of accuracy and speed when analyzing elements and can also detect ultra-light elements; and the EDX-LE/EDX-LE Plus, which are designed specifically for screening elements regulated by RoHS/ELV directives. Learn more about our full lineup and how you can enhance your laboratory performance below.
The whole series meets 05 grade (Highest Grade) of JIS B 7738 Coil Spring Compression / Tension Tester.
• In addition to 1 Step , 2 -Step, 3 -Step Automatic Tests, Free Length, Initial Tension, Solid Length, Peak Load can be measure.
• Unit select able among N, gf, kgf, lbf and inch covered by English version.
• Measurement range can be changed through 2- step high-low range automatic switch over function, there by eliminating unnecessary steps.
• Dual unit (gf, kgf and N) printing is possible through printer setting. 50 Tests conditon can be store by registering model number.
• Test can start immediately once test condition are recall.
• Passing range or Good / Bad assessment is done visually by using screen display and alarm.
• Can connect to Mitutoyo Digimatic Caliper, Micrometer etc.. And data can be printed out.
• Ascend and descend buttons are equipped with inching function.
• Simple movements of 1mm, 0.1mm, (0.001mm) are possible.
“Load test with length input”, load is measured automatically once length is input. (All-Type)
”Length test with Load input”, spring length is measured automatically once load is input. (S-Type, H-Type)
”Deflection load test”, load is measured automatically based on deflection amount resulted from free length. (S-Type, H-Type)
”Load deflection test”, deflection amount corresponding to applied load resulted from free length is measured automatically.
”Step load test”, load is measured as length is step automatically fixed intervals. (H-Type)
”Step length test”, length is measured as load is step automatically fixed intervals. (H-Type)
