LEAF SPRING TESTER

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Description:

CHARACTERISTICS

LEAF-5000 is a high capacity leaf spring tester, mainly use in the automotive industries for trucks and lorry.
Tester able to preset distance to find the load and also preset the deflection of leaf spring to find load.
Software program is available to enhance the testing with data and testing condition storage.

More Other Products:

DIGITAL ROCKWELL HARDNESS TESTER

FEATURES

–>LIQUID CRYSTAL DISPLAY TOUCH-PANEL
Loaded with a LCD display with backlight. The hardness tester secures very clear and high visibility
–>AUTO START
After setting the reference load, the test load is applied automatically . (Manual start is also possible)
–>EASY SETTING
Reference load can be easily set with a bar graph display on the bright screen and electronic sound. More over, an error-preventing device is also mounted.
–>PLASTIC MEASURING SYSTEM
Specific measuring method for plastic in compliance with ASTM and JIS is activated by one-touch easy operation. Time for reading the value after unloading the test load can be set freely
–>VARIOUS DATA PROCESSING FUNCTIONS
It makes acceptance and rejection judgement, conversion to other scales, and tabulation and computing for data memory (256 data), maximum value, minimum value, variation, average, standard deviation etc.
–>TRADITIONAL DIAL CHANGE-OVER SYSTEM
Dial changeover systems make change the test load easily by turning the dial.
Accordingly the design is dust-proof including the weights for test load.
–>APPLICABLE TO CE AND SAFETY
Safety design applicable to EU low voltage command, EMC command and machine command. In addition to high-rigidity body , overturn-preventive metal fittings are attached as standard to prevent overturning by earthquakes etc.

Custom Clamp & Inserts

Custom Fabrication of Clamps & Inserts for the Semiconductor Industry

We specialize in the custom design and fabrication of precision clamps and inserts engineered specifically for the stringent requirements of the semiconductor industry, where accuracy, cleanliness, and repeatability are critical.

Our clamps and inserts are designed to secure delicate components without inducing stress, deformation, or contamination, making them ideal for inspection, metrology, assembly, testing, laser processing, and automation applications. Each solution is tailored to the exact geometry, material, tolerance, and process conditions of the customer’s application.

Key Capabilities & Benefits:

Custom clamps and inserts for wafers, leadframes, packages, substrates, and precision parts
Designed for vision systems, CMMs, laser systems, and automated equipment
High-precision machining to support tight tolerances and repeatable positioning
Materials compatible with cleanroom, ESD-sensitive, and chemical-resistant environments
Minimizes part movement, vibration, and measurement error
Reduces setup time and improves process consistency
Built for high-volume and high-mix semiconductor manufacturing

From concept and design to fabrication and validation, our clamps and inserts are built to protect critical parts while maximizing process accuracy and throughput. Classic precision, modern execution—because in semicon, microns matter. 🔬✨

CHARACTERISTICS

ASKER Model F – ASKER Model FP
Exclusive type for foam materials, allowing measurement by placing the tester on the object o measurement.
In addition to Model F, Model FP is available for powder puff.
ASKER Model CS
This features larger indentor and a more strong spring compared to ASKER C, thereby making it more suitable for polystyrene foam.
ASKER Model JA
A hardness tester which conforms with the Japanese Industrial Standards JIS K 6301. One of the most popular types in Japan, but has recently been gradually replaced with the ISO-specified Type A
ASKER Model B
It uses the same spring load used in ASKER Model A. It adopts a conical indentor similar to that of Model D, so as to be applicable to harder measuring objects than can be measured by Model A.
It is useful for hardness measurement of unglazed pottery clay and ceramics
in green condition.
ASKER Model D
Similar to ASKER Model A, this model is defined as ‘Durometer Type D’ as described in various domestic and international standards. It is in widespread
use for hardness measurement of plastics and hard rubber.
ASKER Model C – ASKER Model C2
ASKER Model C is intended for hardness measurement of soft rubber, sponge, foamed elastomers, wound threads(yarn package), rolled films, potter’s clay(kaolin), and other such soft materials.
For even softer materials, Model C2 is available
ASKER Model A
Has been used for wide applications since being standardized in the ISO.
ASKER Model JAL
Especially useful for recessed and/or smaller measuring areas.
In addition to the standard Mode JAL, long presser foot types are available for another Model applications.
ASKER Model JC
ASKER JC have those hardness testers described in JIS K 6301 as ‘suitable for samples found to have a hardness value above 70 according to Model A’. It features higher resolution for hardness measurement of hard rubber.

Custom Fabrication Window Clamp & Anvil Block

Custom Fabrication of Window Clamps & Anvil Blocks for the Semiconductor Industry

We provide custom fabrication of precision window clamps and anvil blocks designed to meet the high-accuracy, low-stress requirements of semiconductor manufacturing and inspection processes.

Our window clamps are engineered to securely hold delicate semiconductor components while maintaining a clear inspection or processing window, making them ideal for optical measurement, laser applications, metrology, and vision systems. The design ensures maximum stability without obstructing critical areas, enabling accurate, repeatable results.

Our anvil blocks are precision-machined to serve as stable reference and support surfaces for pressing, alignment, bonding, inspection, and measurement operations. Built for flatness, rigidity, and durability, they help maintain consistent part positioning and process reliability, even in high-volume environments.

Key Features & Benefits:

Custom-designed window clamps and anvil blocks based on part geometry and process requirements
Supports applications such as laser decapping, cross-sectioning, inspection, metrology, and automation
High-precision machining for tight tolerances and repeatable positioning
Minimizes stress, deformation, and vibration on sensitive semiconductor parts
Materials compatible with cleanroom, ESD-safe, and contamination-controlled environments
Improves measurement accuracy, process stability, and throughput
Suitable for R&D, pilot lines, and full production

From design validation to final fabrication, our window clamps and anvil blocks are built to protect critical components while enabling precise, unobstructed access for inspection and processing—because in semiconductor manufacturing, control, consistency, and microns matter. 🔬⚙️

If you want, I can also:

condense this into a one-paragraph website version
make a highly technical spec-style description
or tailor it for laser, metrology, or FA equipment applications